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Product Description：
IEC 60529 Test probe kits with Thrust
Model:BND-TPK08
Product Overview:
Our range of IEC 60529 test probes includes:
Sphere 50 mm Diameterprobe with 50N Force(BND-AF)
Ideal for testing protection against access to hazardous parts.
Ensures compliance with international safety standards.
Jointed Test Finger probe with 10N Force(BND-BF10)
Mimics human finger for realistic testing scenarios.
Highly accurate and durable.
Test Rod 2.5 mm Diameter, 100 mm Long with 3N Force(BND-CF)
Perfect for testing small openings.
Precision-engineered for reliable results.
Test Wire 1.0 mm Diameter, 100 mm Long with 1N Force(BND-DF)
Designed for intricate testing requirements.
Ensures thorough inspection of small gaps.
Electrical Contact Indicator for test probes(BND-ZSQ)
Provides safe, controlled low-voltage supply for various tests.
Essential for comprehensive safety assessments.
Detailed Product Descriptions
| BND-AF test probe A with 50N | test probe A with 50N | IEC60529 IEC61032 IEC60335 IEC61029 IEC60745 IEC60065 IEC60950 | Ball Diameter:50mm Baffle Plate Diameter:45mm Baffle Plate Thickness:45mm Handle Diameter:10mm Handle Length:100mm Force :10N/20N/30N/40N/50N. |
| BND-BF10 | test probe B with 10N | IEC61032 IEC60950 IEC60335 IEC60529 IEC60045 IEC60884 IEC60745 | Knurled Finger Diameter:12mm Knurled Finger Length:80mm Baffle Plate Diameter:50mm Baffle Plate Length:100mm Baffle Thickness:20mm Force :10N. |
| BND-CF | test probe C With 3N | IEC60335 IEC 61032 IEC 60529 | Test Probe Length:100mm Test probe Diameter:2.5mm Dam-sphere Diameter:3.5mm Handle Diameter:10mm Handle Length:100mm With force: 3N |
| BND-DF | test probe D with 1N | IEC60335 IEC 61032 IEC 60529 | Test Probe Length:100mm Test Probe Diameter:1.0mm/2.5mm Dam-sphere Diameter:35mm Handle Diameter:10mm Handle Length:100mm Force:1N |
| BND-ZSQ | Electrical Contact Indicator for Test Finger Probe | IEC 60335 IEC 61032 IEC 60529 | Input: AC 180-250V Output: 41-43V Fuse: 220V 2A |
